Newest Research: Remote Plasma Cleaning of Optical Surfaces
An extended study on an advanced method for the cleaning of carbon contaminations from large optical surfaces using a remote inductively coupled low-pressure RF plasma
ibss Group is exhibiting at ACMM in Canberra, Australia – February 2020. We welcome local EM and TEM users to visit ibss booth during ACMM. Please contact to schedule an on-site demo.
Read moreEric Pellegrin of Cells Alba, a ibss Group, Inc. partner, has been invited to present findings regarding GV10x performance on Synchrotrons at SRI 2018 in Taipei, Taiwan. The Synchrotron Radiation Instrumentation (SRI 2018) will be hosted by
Read moreDear ibss Group Users,For support on ibss products in Japan please contact an authorized representative:Toshiyuki ShamotoElminet [email protected] you for your business.Sincerely,ibss Group, Inc.
Read moreOn March 18, 2016 ibss Group conducted a sales meeting in Shanghai for its Asian representatives. Chinese companies in attendance were Beijing Python, Beijing United Cosmos, Hong Kong Guangdong, Jun Yi Tech, and Shanghai Risen. Focus Tek of Korea, Inte
Read moreibss Group is pleased to announce that its partner, Kammrath & Weiss, will offer GV10x DS Asher Demonstrations in their Dortmund lab. Located in Dortmund, Germany, Kammrath & Weiss has over thirty years’ experience converting customer applicati
Read moreAn extended study on an advanced method for the cleaning of carbon contaminations from large optical surfaces using a remote inductively coupled low-pressure RF plasma
Downstream Asher for In-Situ Specimen and Specimen Chamber Cleaning presentation, showing before/after cleaning images and adjacent area scans. The ibss GV10x cleaner removed nearly all
Characterization, optimization and surface physics aspects of in situ plasma mirror cleaning Although the graphitic carbon contamination of synchrotron beamline optics has been an obvious
Downstream Plasma Technology for Cleaning TEM Samples on Carbon Films Plasma cleaning has become an essential step in modern analytical electron microscopy, which requires contamination-free