November 12 - 16, 2023

Phoenix Convention Center - Phoenix, AZ, USA

The 49th International Symposium for Testing and Failure Analysis (ISTFA) is the premier event for microelectronics failure analysis. The focus on moving toward developing efficient and reliable power electronic devices for high-performing hardware components. The complexity of highly integrated SiC and GaN devices requires an in-depth understanding of defect formation and degradation mechanisms as well as adapted failure analysis methodologies. Visit ibssGroup at the conference to learn how GV10x innovative products can improve reliability and and improve robustness in manufacturing.