43rd International Symposium for Testing and Failure Analysis (ISTFA)
Santa Barbara, CA -April 8 2017 -
The SOUTHERN CALIFORNIA SOCIETY FOR MICROSCOPY & MICROANALYSIS is dedicated to increasing interest and information in all areas of microscopy and microanalysis, including, but not limited to: transmission electron, scanning electron and electron microprobe, ion probe, microbeam analysis, optical and confocal microscopies, and microspectroscopies.
The European conference that plays host to the most recent advances in laser technology worldwide. The information is presented by leading researchers, engineers and programme managers covering high-power, high-intensity and high-energy lasers, metamaterials, nonlinear optics, quantum optics, sensors, holography, EUV and X-ray optics, research using extreme light, and much more.
The primary aim of this combined EMAS Workshop / IUMAS Meeting is to assess the state of the art and reliability of microbeam analysis techniques. EMAS was founded in 1987 to meet the growing demands of microanalysis users and scientists across Europe for further education, communication and professional advice. IUMAS was founded in 1994 to promote world-wide cooperation in all aspects of microbeam analysis through the organisation of an international meeting on microbeam analysis every three or four years, and by participating in joint committees with other scientific organisations in matters relevant to microbeam analysis which are better discussed on a world scale.
The Microscience Microscopy Congress is set to be as big and as bold as ever with six parallel conference sessions, an exhibition with more than 100 companies represented, and a brilliant selection of features such as pre-event workshops and turn-up-and-learn training opportunities.
IPFA 2017 is organized by the IEEE Reliability / CPMT / ED Singapore Chapter, IEEE Electron Devices Society Chengdu Chapter and the University of Electronic Science and Technology of China ( UESTC ) . The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society. IPFA 2017 will be devoted to the fundamental understanding of the physical mechanisms governing failure in a large variety of advanced semiconductor devices and the electrical - physical failure analysis techniques, methodologies and tools that could be use to reliably identify the root cause of failure in these devices.
The Microscopy Society of America (MSA), the Microanalysis Society (MAS), and the International Field Emission Society (IFES) gather at the M&M 2017 Annual Meeting and Exhibition at the America’s Center Convention Complex
Present and publish at SPIE Photomask Technology + Extreme Ultraviolet Lithography 2017, a technical meeting for mask makers, EUVL, emerging technologies, and the future of mask business.